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SiC Webinar June 2023 - On Demand StdTpc-Jig ID This marking symbol is marked

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This marking symbol is marked in a manner and location to avoid affecting the user patterning process

NOTICE: This document is no longer published with the SEMI E54 suite of standards

• extract the edge profile characteristic parameters by fitting lines or arcs to portions of the measured edge profile at defined distances from the periphery of the wafer and compare them with the specified values

This Specification is intended for use in procurement of polycrystalline silicon for growth of electronic grade monocrystalline silicon ingots

Applications are drawn from electronics

SiC Webinar June 2023 - On Demand StdTpc-Jig ID This marking symbol is marked

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