G04200 - SEMI G42 - 半導体パッケージのジャンクション部と周囲間の熱抵抗測定用標準熱抵抗測定基板の仕様 StdPbc-1114 widely applicable

widely applicable

3-0600 SEMI M23

It is suitable for use only on wafers with angular deviations in the range from −5° to +5°

11-0698 (first published)

この仕様は，完全なシステム，サブシステム，および個々の部品に対する試験方法が含まれる。

G04200 - SEMI G42 - 半導体パッケージのジャンクション部と周囲間の熱抵抗測定用標準熱抵抗測定基板の仕様 StdPbc-1114 widely applicableglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1986200411 : Referenced SEMI Standards SEMI G32 Guideline for Unencapsulated Thermal Test Chip SEMI G38 Test Method for Still and Forced Air Junction to Ambient Thermal Resistance Measurements of Integrated Circuit Packages