MF176300 - SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer Revision:SEMI MF1763-0318 - Superseded In this Standard

In this Standard

It has been replaced by SEMI F118

コンピュータおよび通信システム

SEMI M42-1000 (first published)

High Speed Message Transfer (HSMS) Generic Services

MF176300 - SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer Revision:SEMI MF1763-0318 - Superseded In this StandardPolarizer contrast is important in polarimetry systems, ellipsometers, optical modulators, shutters, and target signature discrimination based on polarized radiation. This Test Method covers measurement of polarizer contrast. It provides procedures suitable for use in service evaluation, manufacturing control, or for research and development purposes. They are not recommended for use in acceptance testing until their precision has been evaluated by