Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced) Ingestion-build-48974 Cone diameter tolerance (TD)

Cone diameter tolerance (TD)

Type 4 is known as a turned finish

BS 7194 provides general information for markings and symbols that enhances the quality of the product

In the context of the present standard

EN 16232:2013

Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced) Ingestion-build-48974 Cone diameter tolerance (TD)What is BS EN 60749 31 Plastic encapsulated devices about? BS EN 60749 31 is an international standard that focuses on mechanical and climatic test methods for semiconductor devices. BS EN 60749 31 establishes mechanical and climatic test methods for semiconductor devices with memory when subjected to energetic particles such as alpha radiation. It can be applied to any type of integrated circuit with a memory device. Note: BS EN 60749 31 is identical