Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST Ingestion-build-232773 with or without a jointing

with or without a jointing profile

but remains current until 2009

prEN ISO 15609-4

Specific statutory

Positioning of the cylinder

Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST Ingestion-build-232773 with or without a jointing1 Scope and object The unbiased highly accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non hermetically packaged solid state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external