Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (externally induced) Ingestion-build-59651 as excited by slamming

as excited by slamming

BS EN 1997-1:2004+A1:2013 Eurocode 7

hence to its mass (see also 7

Revised and extended requirements on packaging and marking (Clause 12)

BS ISO 26021-2:2008 Road vehicles

Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (externally induced) Ingestion-build-59651 as excited by slamming1 Scope and object This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. NOTE This test is identical to the test method contained in 1. 2 of chapter 4 of IEC 60749