Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures Ingestion-build-107062 This document does not apply

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This part of IEC 61869 provides technical information for understanding the undesirable phenomenon of ferroresonance oscillations in medium voltage and high voltage networks in connection with inductive voltage transformers

Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures Ingestion-build-107062 This document does not apply1 Scope This document specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super lattice structure of semiconductor or an analysing crystal for X ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the