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VGF-Ge Wafer(100) . 100 mmdia x 0.175 mm, 1SP, P type ( Ga doped) active surface area 50 cm2 A complete calibration system
VGF-Ge Wafer(100) . 100 mmdia x 0.175 mm, 1SP, P type ( Ga doped) active surface area 50 cm2 A complete calibration system
$290.20
Description
A complete calibration system
Ni+Co+Al = (59
~25 microm
small Moliere radius ( 2
5mm(T) Sample weight Less than 250g Dipping/Pulling Motor
VGF-Ge Wafer(100) . 100 mmdia x 0.175 mm, 1SP, P type ( Ga doped) active surface area 50 cm2 A complete calibration systemGe Wafer Specification Growing Method: VGF Orientation: (100) + 0. 5 Deg. Wafer Size: 100(+ 0. 4) mm dia x 175(+ 25) microns Surface Polishing: One side polished Surface roughness: < 8 A Doping: Ga Doped Conductor type: P type Resistivity: (0. 182 0. 327) Ohm. cm (If you would like to measure the resistivity accurately, please order our Portable 4 Probe Resistivity Testing Instrument.) Carrier Concentration: (0. 92 4. 13) E16 c. c Mobility: (1520
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 . 100 mmdia x 0.175 mm, 1SP, P type ( Ga doped) active surface area 50 cm2 A complete calibration system){kind=link}
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