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Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased autoclave Ingestion-build-58863 At temperatures below −40 °C

$142.00

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Description

At temperatures below −40 °C

Design brief

The standard determines requirements for structural strength/integrity

enabling safe handling

Addition of the word “not” in 10

Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased autoclave Ingestion-build-58863 At temperatures below −40 °C

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